New Instrument in the Electron Microscopy Core!
The Electron Microscopy Core facility on East campus has received a JEOL JSM-IT500HR Field Emission Scanning Electron Microscope. This FESEM offers high resolution at your fingertips, achieving 1.5nm at 30kV and 4.0nm at 1kV. Its large analytical chamber with multiple ports accommodates a variety of detectors for imaging and analysis; secondary and backscatter electron detectors, and energy dispersive spectroscopy and electron backscatter diffraction techniques. This game-changing FESEM provides expanded performance with the ease of operation, a seamless transition from optical light microscopy. Contact Olivia Thomson, oathom1@uic.edu, for more information.
Modified on December 16, 2019