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New Instrument in the Electron Microscopy Core!

JEOL JSM-IT500HR Field Emission Scanning Electron Microscope

The Electron Microscopy Core facility on East campus has received a JEOL JSM-IT500HR Field Emission Scanning Electron Microscope.  This FESEM offers high resolution at your fingertips, achieving 1.5nm at 30kV and 4.0nm at 1kV.  Its large analytical chamber with multiple ports accommodates a variety of detectors for imaging and analysis; secondary and backscatter electron detectors, and energy dispersive spectroscopy and electron backscatter diffraction techniques.  This game-changing FESEM provides expanded performance with the ease of operation, a seamless transition from optical light microscopy.  Contact Olivia Thomson,, for more information.